Program



All the time slots are in Pacific Time (PT)

Thursday 14th

3:30 pm PT
Opening
3:40 pm PT
Keynote - Rich Bonderson (Google)
4:20 pm PT
Technical Session 1 (3 presentations)
(Session Chair: Yiorgos Makris, UT Dallas, US)
5:00 pm PT
End of Day 1

Friday 15th

8:00 am PT
Keynote - Ravi Iyer (UIUC)
8:45 am PT
Technical Session 2 (3 presentations)
(Session Chair: Waleed Khalil, OSU, US)
9:40 am PT
Break
09:50 am PT
Technical Session 3 (3 presentations)
(Session Chair: Hussam Amrouch, Uni Stuttgart, DE)
10:45 am PT
Technical Session 4 (3 presentations)
(Session Chair: Gajinder Panesar, Siemens, UK)
11:50 am PT
Lunch/Dinner Break
12:45 pm PT
Technical Session 5 (3 presentations)
(Session Chair: Mehdi Sadi Auburn U, US)
1:40 pm PT
Panel Discussion
3:00 pm PT
Closing


Keynotes


Title: Training in turmoil: Silent data corruption in systems at scale.

Speaker: Rich Bonderson, Google

Download slides

Abstract: As Silicon process technology marches on and system scale continues increasing, are our traditional methods of ATE and functional testing enough to keep up? What can we do in the face of silent data corruption and quality challenges? Are there new opportunities for efficient solutions for closing test gaps and increasing defect detection and mitigation? We set out with these questions and a call for action in the industry in attacking an increasing problem.


Title: Resilience of AI-driven Applications

Speaker: Ravishankar K. Iyer, University of Illinois Urbana-Champaign (US)

Abstract: The emerging innovations in computer science and engineering are being driven by a data driven AI/ML promise to seamlessly and significantly augment human capabilities. To be successful these systems must interact with other manmade and natural systems with a focus on the flawless capabilities of dynamic decision-making algorithms. Applications, such as, autonomous vehicles, robotic management and control, and enterprise scale computing - all driven by advanced data-analytics and artificial intelligence algorithms, have spawned a level of complexity where traditional methods cannot form the backbone for resilient and safe system design. Using data on operational failures of autonomous vehicles, surgical robots, and extreme-scale computing systems as examples, this talk will discuss features of our research that leverage probabilistic graphical models (PGMs) jointly with deep learning (DNNs) for building and validating a new generation of resilient and safety-critical AI applications.



Panel


Title: "The silicon lifecycle management ecosystem at large"

Abstract - Silicon Lifecycle Management (SLM) is an emerging topic in academia and industry, with notable applications including data center and automotive. In the data center application, the cost of downtime due to silicon failure is paramount which needs to be carefully managed. In the automotive, the era of Electric Vehicles and Autonomous Driving is driving very different mission profiles than we can act like business as usual. Like any emerging topic, however, there are many lingering questions:

  • How does the SLM fit in the paradigm shift of funding agency and research consortium?
  • What are the business opportunities enabled by the SLM and how to get there?
  • Do we have everything we need to build the technology, e.g., sensors, data analytics, tools, etc.?
  • What about false positives and false negatives?

The panelists representing the different fields of the ecosystem will bring their unique perspectives to the above questions and expect a lively discussion with the audience.

Moderator: Robert Jin (NXP Semiconductors)
Panelists:
  • Serge Leef (DARPA)
  • John Oakley (Semiconductor Research Corporation)
  • Anis Jarrar (NXP Semiconductors)
  • Yervant Zorian (Synopsys)
  • Krishnendu Chakrabarty (Duke University)
  • Mark Tehranipoor (University of Florida)



List of technical presentations


Session#

Name

Affiliation

Title of presentation

1

Mehul Shroff

NXP

Addressing the Lifecycle Challenge for Automotive-IC Reliability and Quality in Advanced CMOS

1

Prashant Seetharaman

Siemens

Unprecedented Scaling Demands Have Changed The Face Of EDA

1

Robert Kwasnick

Intel

Telemetry for System Reliability 

2

Evelyn Landman

ProteanTecs

Electronics Health and Performance Monitoring from Production to the Field with Deep Data Analytics

2

Stephen Crosher

Synopsys

The Critical Role of In-Silicon Visibility, Measurement, and Intelligent Analysis from Design to In-Field

2

Dan Alexandrescu

iRoc

Extracting Added Value from Test

3

Lorenzo Servedai

Infineon 

Accurate and Robust Malware Detection: Running XGBoost on Run-Time Data from Performance Counters

3

Navid Asadi

UF

physical assurance for electronics

3

Tao Zhang

UF

Enabling Holistic Protection of FPGA Supply Chain with Blockchain Technology

4

Lee Harrison

Siemens

Using Silicon Lifecycle Management to Monitor Aging Effects on Automotive Electronics

4

Lorena Anghel

Spintec, FR

Aging-Aware Operating Performance Points Adaptation for Embedded Applications Lifetime Extension

4

Gurgen Harutyunyan

Synopsys

Leveraging SLM monitors for IP characterization and bring up

5

Jyotika Athavale

NVIDIA

IEEE P2851: A Landscape for the Development of Dependable Machines

5

Haralampos Stratigopoulos 

LIP6

SLM for mixed-signal circuits

5

Aileen Ryan

Siemens

Use of Functional monitoring for Inlife latency reduction